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Acta Physica Sinica, Volume. 69, Issue 6, 060201-1(2020)

Transient characteristics of electron beam induced current in dielectric and semiconductor sample

Wei-Qin Li1,2、*, Zhi-Sheng Huo1, and Hong-Bin Pu1
Author Affiliations
  • 1School of Automation & Information Engineering, Xi’an University of Technology, Xi’an 710048, China
  • 2Department of Electronic Science and Technology, Xi’an Jiaotong University, Xi’an 710049, China
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    Wei-Qin Li, Zhi-Sheng Huo, Hong-Bin Pu. Transient characteristics of electron beam induced current in dielectric and semiconductor sample[J]. Acta Physica Sinica, 2020, 69(6): 060201-1

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    Paper Information

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    Received: Oct. 10, 2019

    Accepted: --

    Published Online: Nov. 19, 2020

    The Author Email:

    DOI:10.7498/aps.69.20191543

    Topics

    Nuclear physics
    Particles and fields
    Particle and nuclear astrophysics and cosmology