Fig. 1. Schematic of currents generated by the interaction of e-beams with samples.

Fig. 2. Schematic diagram of the experimental device.

Fig. 3. Simulated (lines) and experimental (squares) results of total electron yield.

Fig. 4. Simulated free charge densities N(t) along the incident direction.

Fig. 5. Simulated net space densities (P(t) – N(t)) along the incident direction.

Fig. 6. Simulated (a) space potentials V(t) and (b) space fields F(t) along the incident direction.

Fig. 7. Simulated (line) and experimental (squares) effective emission currents I_I.

Fig. 8. (a) Simulated I_EBIC and I_TE; (b) simulated (line) and experimental (squares) I_S.

Fig. 9. Simulated I_EBIC in the steady state under the different values of beam current I_B.

Fig. 10. Simulated I_TE as a function of the irradiation time in the different beam energies E_B.

Fig. 11. Simulated I_EBIC as a function of the irradiation time in the different beam energies E_B.