Measurement of high reflectivity uniformity of curved mirrors based on cavity ring-down technique

Haihong Cai; Bincheng Li; Yanling Han; Jing Wang; Hao Cui

doi:10.12086/oee.2025.250059

Opto-Electronic Engineering, Volume. 52, Issue 7, 250059(2025)

Measurement of high reflectivity uniformity of curved mirrors based on cavity ring-down technique

Haihong Cai¹, Bincheng Li^1,2、*, Yanling Han^1,3, Jing Wang^1,2, and Hao Cui^1,2

¹School of Optoelectronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, Sichuan 610054, China

²State Key Laboratory of Adaptive Optics, Chengdu, Sichuan 610209, China

³Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu, Sichuan 610209, China

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References(18)

[1] Li M Z, Hou X, Zhao W C et al. Current situation and development trend of aspheric optical surface defect detection technology (invited)[J]. Infrared Laser Eng, 51, 11-30(2022).

[2] Wang L F, Hu Y W, Zhang Z G et al. Rapid manufacturing technology for aspheric optical elements[J]. Opto-Electron Eng, 51, 230171(2024).

[3] Tan Z Q, Ji H T, Mao Y H et al. Review of backscattering problems in optical gyros (invited)[J]. Infrared Laser Eng, 52, 20230181(2023).

[4] Duparré A, Ristau D. Optical interference coatings 2010 measurement problem[J]. Appl Opt, 50, C172-C177(2011).

[5] Li B C, Gong Y. Review of cavity ring-down techniques for high reflectivity measurements[J]. Laser Optoelectron Prog, 47, 0212023(2010).

[6] Cui H, Li B C, Han Y L et al. Extinction measurement with open-path cavity ring-down technique of variable cavity length[J]. Opt Express, 24, 13343-13350(2016).

[7] Li B C, Cui H, Han Y L et al. Simultaneous determination of optical loss, residual reflectance and transmittance of highly anti-reflective coatings with cavity ring down technique[J]. Opt Express, 22, 29135-29142(2014).

[8] Cui H, Li B C, Xiao S L et al. Simultaneous mapping of reflectance, transmittance and optical loss of highly reflective and anti-reflective coatings with two-channel cavity ring-down technique[J]. Opt Express, 25, 5807-5820(2017).

[9] Han Y L, Li B C, Gao L F et al. Reflectivity mapping of large-aperture mirrors with cavity ringdown technique[J]. Appl Opt, 56, C35-C40(2017).

[10] Li B C, Qu Z C, Han Y L et al. Optical feedback cavity ring-down technique for high reflectivity measurement[J]. Chin Opt Lett, 8, 94-98(2010).

[11] Gong Y, Li B, Han Y. Optical feedback cavity ring-down technique for accurate measurement of ultra-high reflectivity[J]. Appl Phys B, 93, 355-360(2008).

[12] Qu Z C, Li B C, Han Y L. Influence of test mirror’s misalignment on high reflectivity measurement with cavity ring-down technique[J]. Acta Photon Sin, 40, 1366-1371(2011).

[13] Yi H Y, Lü B D, Hu X Y et al. Influence of length misadjustment on metrical precision by cavity ring-down method[J]. High Power Laser Part Beams, 16, 993-996(2004).

[14] Yi H Y, Lü B D, Zhang K. Analysis of cavity mirrors’ tilt in ring-down cavity[J]. Laser Technol, 30, 5-8(2006).

[15] Tan Z Q, Long X W. Influence of mode mismatch on measurement of continuous-wave cavity ring-down technology[J]. Chin J Lasers, 34, 962-966(2007).

[16] Truong G W, Winkler G, Zederbauer T et al. Near-infrared scanning cavity ringdown for optical loss characterization of supermirrors[J]. Opt Express, 27, 19141-19149(2019).

[17] Gutierrez N, Degallaix J, Hofman D et al. Optical characterization of high performance mirrors based on cavity ringdown time measurements with 6 degrees of freedom mirror positioning[J]. Rev Sci Instrum, 94, 105113(2023).

[18] Cui H, Li B C, Xiao S L et al. Simultaneous measurement of S- and P-polarization reflectivity using optical feedback cavity ring down technique[J]. J Univ Electron Sci Technol China, 47, 307-310(2018).

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Haihong Cai, Bincheng Li, Yanling Han, Jing Wang, Hao Cui. Measurement of high reflectivity uniformity of curved mirrors based on cavity ring-down technique[J]. Opto-Electronic Engineering, 2025, 52(7): 250059

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Paper Information

Category: Article

Received: Feb. 28, 2025

Accepted: May. 8, 2025

Published Online: Sep. 4, 2025

The Author Email: Bincheng Li (李斌成)

DOI:10.12086/oee.2025.250059

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology