Opto-Electronic Engineering, Volume. 52, Issue 7, 250059(2025)

Measurement of high reflectivity uniformity of curved mirrors based on cavity ring-down technique

Haihong Cai1, Bincheng Li1,2、*, Yanling Han1,3, Jing Wang1,2, and Hao Cui1,2
Author Affiliations
  • 1School of Optoelectronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, Sichuan 610054, China
  • 2State Key Laboratory of Adaptive Optics, Chengdu, Sichuan 610209, China
  • 3Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu, Sichuan 610209, China
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    Figures & Tables(14)
    Schematic diagram of measurement principle for distribution of high reflectivity on curved surface. (a) The initial ring-down cavity; (b) The test ring-down cavity; (c) The parallel beams incline after reflected by the curved mirror; (d) Establish a spherical coordinate system
    Schematic diagram of reflectivity distribution measurement device
    5-dimensional degree-of-freedom motion control system
    Repeat the measurement 30 times at different positions
    Repeat the measurement of sample 1. (a) 2D reflectivity distribution map; (b) 2D standard deviation distribution map
    Grayscale image of laser intensity obtained by scanning sample 1 with laser confocal microscope
    Scanning results of sample 1. (a) 1D reflectivity scan diagram of measurement device; (b) 1D amplitude scan diagram of measurement device
    Comparison between true value and auto-scanning value. (a) Overall comparison of reflectivity; Reflectivity distribution histogram of (b) region Ⅰ, (c) region Ⅱ, and (d) region Ⅲ
    Repeated measurement sample 2. (a) 2D reflectivity distribution map of reflectance; (b) 2D standard deviation distribution map
    Repeated measurement sample 3. (a) 2D reflectivity distribution map of reflectance; (b) 2D standard deviation distribution map
    • Table 1. Scanning aperture of samples with different radius of curvature

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      Table 1. Scanning aperture of samples with different radius of curvature

      Radius of curvature/mmScanning aperture/mm
      1000139.51
      2000279.03
      4000558.05
      6000837.08
      80001116.10
    • Table 2. Sample parameters

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      Table 2. Sample parameters

      Sample numberDiagram of sampleAOI/(°)Formula of surface/mmReflectivity/%
      10>99.9
      20>99.99
      345>99.99
    • Table 3. Repeated measurement results

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      Table 3. Repeated measurement results

      Position/mmAverage/%
      Horizontal (0,0)99.9838±0.6×10−4
      Horizontal (−5,0)99.9832±1.3×10−4
      Vertical (0,0)99.9838±0.5×10−4
      Vertical (0,−5)99.9837±0.7×10−4
    • Table 4. Average and standard deviation of reflectivity in each region

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      Table 4. Average and standard deviation of reflectivity in each region

      RegionAverage of auto-scanning/%Average of true value/%
      Region Ⅰ99.9893±0.006999.9905±0.0010
      Region Ⅱ99.9908±0.001099.9903±0.0009
      Region Ⅲ99.9899±0.000999.9901±0.0008
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    Haihong Cai, Bincheng Li, Yanling Han, Jing Wang, Hao Cui. Measurement of high reflectivity uniformity of curved mirrors based on cavity ring-down technique[J]. Opto-Electronic Engineering, 2025, 52(7): 250059

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    Paper Information

    Category: Article

    Received: Feb. 28, 2025

    Accepted: May. 8, 2025

    Published Online: Sep. 4, 2025

    The Author Email: Bincheng Li (李斌成)

    DOI:10.12086/oee.2025.250059

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