Laser & Optoelectronics Progress, Volume. 61, Issue 10, 1012005(2024)

Dynamic Line-Scan Profile Measurement Method Based on Color-Encoded Structure Light

Haoyue Liu, Linghui Yang*, Luyao Ma, and Yiyuan Fan
Author Affiliations
  • State Key Laboratory of Precision Measurement Technology and Instrument, Tianjin University, Tianjin 300072, China
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    Figures & Tables(17)
    Schematic of the extendable surface measurement system based on color-encoded fringe projection and stereoscopic line-scan cameras
    Color composite fringe after binary dithering
    Measurement model of stereoscopic line-scan cameras
    Red image captured by RGB line-scan camera and separated three-channel images
    Experimental setup of the extendable surface measurement system
    Intensity of a captured image of a row in the blue image. (a) Before crosstalk compensation; (b) after crosstalk compensation
    One of the sinusoidal fringe images extracted from a single channel. (a) Before crosstalk compensation; (b) after crosstalk compensation
    Point cloud of ceramic plate
    Double-sphere model and measurement result. (a) The model; (b) stitched image by the line-scan camera; (c) point cloud of the model
    Distance between the center of the fitted spheres of point cloud
    Measurement results of the standard balls of the double-sphere model
    Measurement results of the top of the standard balls of the double-sphere model
    The router
    Images of the router obtained by left and right cameras
    Point cloud and details of the router. (a) Point cloud with texture; (b) heat map point cloud reflecting height information
    Metal workpiece. (a) Photo of the object; (b) point cloud measurement result
    Measurement point cloud and standard point cloud of metal workpiece. (a) Before registration; (b) after registration
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    Haoyue Liu, Linghui Yang, Luyao Ma, Yiyuan Fan. Dynamic Line-Scan Profile Measurement Method Based on Color-Encoded Structure Light[J]. Laser & Optoelectronics Progress, 2024, 61(10): 1012005

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Nov. 9, 2023

    Accepted: Dec. 18, 2023

    Published Online: Apr. 29, 2024

    The Author Email: Linghui Yang (icelinker@tju.edu.cn)

    DOI:10.3788/LOP232455

    CSTR:32186.14.LOP232455

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