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Laser & Optoelectronics Progress, Volume. 61, Issue 10, 1012005(2024)

Dynamic Line-Scan Profile Measurement Method Based on Color-Encoded Structure Light

Haoyue Liu, Linghui Yang*, Luyao Ma, and Yiyuan Fan
Author Affiliations
  • State Key Laboratory of Precision Measurement Technology and Instrument, Tianjin University, Tianjin 300072, China
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    Article index updated: Sep. 8, 2025

    The article is cited by 2 article(s) CLP online library. (Some content might be in Chinese.)
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    Haoyue Liu, Linghui Yang, Luyao Ma, Yiyuan Fan. Dynamic Line-Scan Profile Measurement Method Based on Color-Encoded Structure Light[J]. Laser & Optoelectronics Progress, 2024, 61(10): 1012005

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Nov. 9, 2023

    Accepted: Dec. 18, 2023

    Published Online: Apr. 29, 2024

    The Author Email: Linghui Yang (icelinker@tju.edu.cn)

    DOI:10.3788/LOP232455

    CSTR:32186.14.LOP232455

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology