Acta Optica Sinica, Volume. 40, Issue 7, 0722001(2020)

Tolerance Analysis of Micromirror Array in Deep Ultraviolet Lithography Illumination System

Chao Yin, Yanqiu Li*, Xu Yan, Ke Liu, and Lihui Liu
Author Affiliations
  • Key Laboratory of Photoelectronic Imaging Technology and System, Ministry of Education, School of Optics and Photonics, Beijing Institute of Technology, Beijing 100081, China
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    Figures & Tables(14)
    Layout of beam shaping unit
    Schematic of rotation angle characteristic and reflective light path of micromirror
    Flow chart of tolerance analysis of MMA
    Intensity distributions of illumination modes. (a) QI; (b) DI; (c) Zernike
    Exposure results of angle adjustment error for three kinds of illumination modes. (a) QI; (b) DI; (c) Zernike
    Exposure results of process angle error for three kinds of illumination modes. (a) QI; (b) DI; (c) Zernike
    Exposure results for different Δα and Δβ. (a) Angle adjustment error; (b) process angle error
    Cumulative probability distribution of ΔdCD under tolerance
    • Table 1. Main design specifications of MMA

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      Table 1. Main design specifications of MMA

      ParameterNumberSizeGapRadius
      Value71×710.500 mm×0.707 mm0.0500 mm×0.0707 mm+∞
    • Table 2. Main design specification of other elements

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      Table 2. Main design specification of other elements

      ParameterFocus of microlens /mmFocus of relay condenser /mmDiameter of pupil plane /mm
      Value164.71000150
    • Table 3. Simulation results of angle of micromirror

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      Table 3. Simulation results of angle of micromirror

      Rotation angle (α, β) /(°)(0, 0)(2.12, 0)(-2.12, 0)(0, 3)(0, -3)
      Center coordinate (x, y) /mm(0, 0)(0, -74.23)(0, 74.23)(-74.23, 2.25)(74.23, 2.25)
    • Table 4. Exposure results of ideal illumination mode

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      Table 4. Exposure results of ideal illumination mode

      Illumination modeCDE /%ΔdCD /nm
      QI0.960.269
      DI1.060.297
      Zernike0.200.056
    • Table 5. Exposure results of error illumination mode simulated by Matlab

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      Table 5. Exposure results of error illumination mode simulated by Matlab

      Illumination modeCDE /%ΔdCD /nm
      QI1.200.336
      DI1.210.339
      Zernike0.280.078
    • Table 6. Exposure results of error illumination mode simulated by LightTools

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      Table 6. Exposure results of error illumination mode simulated by LightTools

      Illumination modeCDE /%ΔdCD /nm
      QI1.350.378
      DI1.230.344
      Zernike0.280.078
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    Chao Yin, Yanqiu Li, Xu Yan, Ke Liu, Lihui Liu. Tolerance Analysis of Micromirror Array in Deep Ultraviolet Lithography Illumination System[J]. Acta Optica Sinica, 2020, 40(7): 0722001

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    Paper Information

    Category: Optical Design and Fabrication

    Received: Oct. 8, 2019

    Accepted: Dec. 26, 2019

    Published Online: Apr. 15, 2020

    The Author Email: Yanqiu Li (liyanqiu@bit.edu.cn)

    DOI:10.3788/AOS202040.0722001

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