INFRARED, Volume. 46, Issue 7, 20(2025)

Study on As-Doping of Si-Based HgCdTe Materials by Molecular Beam Epitaxy

Dan WANG, Zhen LI, Meng-jia JIANG, Wei-rong XING, and Chong-shang GUAN
Author Affiliations
  • The 11th Research Institute of China Electronics Technology Group Corporation, Beijing 100015, China
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    References(5)

    [1] [1] Arias J, Zandian M, Pasko J G, et al. Molecular-beam epitaxy growth and in situ arsenic doping of p-on-n HgCdTe heterojunctions[J].Journal of Applied Physics, 1991,69(4): 2143-2148.

    [2] [2] Sivananthan S, Wijewarnasuriya P S, Aqariden F, et al. Mode of arsenic incorporation in HgCdTe grown by MBE[J].Journal of Electronic Materials, 1997,26(6): 621-624.

    [3] [3] VilelaV M F, Olsson K R, Reddy M, et al. Hg1-xCdxTe from short to long wave infrared on Si substrates grown by MBE[J].Physica Status Solidi(c), 2010,7(10): 2518-2521.

    [4] [4] Boieriu P, Chen Y, Nathan V. Low-temperature activation of As in Hg1-xCdxTe (211) grown on Si by molecular beam epitaxy[J].Journal of Electronic Materials, 2002,31: 694-698.

    [5] [5] Selamet Y, Badano G, Grein C H, et al. Electrical Activation and Electrical Properties of Arsenic Doped Hg1-xCdxTe Epilayers Grown by MBE[C].SPIE, 2001,4454: 71-77.

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    WANG Dan, LI Zhen, JIANG Meng-jia, XING Wei-rong, GUAN Chong-shang. Study on As-Doping of Si-Based HgCdTe Materials by Molecular Beam Epitaxy[J]. INFRARED, 2025, 46(7): 20

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    Paper Information

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    Received: Nov. 14, 2024

    Accepted: Aug. 12, 2025

    Published Online: Aug. 12, 2025

    The Author Email:

    DOI:10.3969/j.issn.1672-8785.2025.07.003

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