Acta Optica Sinica, Volume. 42, Issue 4, 0411002(2022)

Terahertz Nondestructive Testing Imaging Technology Based on Linear Frequency Modulation Mechanism

Zhenwei Zhang1,2, Yuejin Zhao1、*, Yinxiao Miao3, and Cunlin Zhang2
Author Affiliations
  • 1Beijing Key Laboratory for Precision Optoelectronic Measurement Instrument and Technology, School of Optics and Photonics, Beijing Institute of Technology, Beijing 100081, China
  • 2Key Laboratory of Terahertz Optoelectronics, Beijing Engineering Research Center of Terahertz and Infrared Technology, Beijing Advanced Innovation Center for Imaging Theory and Technology, Department of Physics, Capital Normal University, Beijing 100048, China
  • 3Beijing Aerospace Institute for Metrology and Measurement Technology, Beijing 100076, China
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    Zhenwei Zhang, Yuejin Zhao, Yinxiao Miao, Cunlin Zhang. Terahertz Nondestructive Testing Imaging Technology Based on Linear Frequency Modulation Mechanism[J]. Acta Optica Sinica, 2022, 42(4): 0411002

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    Paper Information

    Category: Imaging Systems

    Received: Jul. 14, 2021

    Accepted: Aug. 27, 2021

    Published Online: Jan. 29, 2022

    The Author Email: Zhao Yuejin (yjzhao@bit.edu.cn)

    DOI:10.3788/AOS202242.0411002

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