Acta Optica Sinica, Volume. 42, Issue 4, 0411002(2022)
Terahertz Nondestructive Testing Imaging Technology Based on Linear Frequency Modulation Mechanism
Fig. 1. Terahertz frequency modulated continuous wave detection imaging system. (a) Working principle diagram of system; (b) physical map of system; (c) structural diagram of system
Fig. 2. Intensity distribution of focal plane. (a) Before optimization; (b) after optimization
Fig. 3. Photo and terahertz image of sample. (a) Photos of ABS and metal specimen; (b) terahertz C-scan images of ABS and metal specimen
Fig. 4. One-dimensional images before and after correction at different positions. (a) Point S on metal specimen; (b) point A7 on ABS specimen
Fig. 5. Terahertz image of metal specimen. (a) B-scan image at Y=69; (b) three-dimensional image at Y=69; (c) C-scan images at different Z
Fig. 8. B-scan images of ABS specimen at Y=26 under different reference points. (a) S; (b) S7; (c) S8; (d) 0.3S+0.3S7+0.4S8
Fig. 9. High voltage insulation terminal. (a) Photo of sample; (b) B-scan profile at position with rotation angle of 0°; (c) terahertz echo signals at positions 1, 2, and 3 in
Fig. 10. Echo signals in range of 0°--360° at different positions. (a)(c) Position 2; (b)(d) position 3
Fig. 11. Reconstructed terahertz three-dimensional images of high voltage insulation terminal from different perspectives. (a) Oblique view; (b) front view
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Zhenwei Zhang, Yuejin Zhao, Yinxiao Miao, Cunlin Zhang. Terahertz Nondestructive Testing Imaging Technology Based on Linear Frequency Modulation Mechanism[J]. Acta Optica Sinica, 2022, 42(4): 0411002
Category: Imaging Systems
Received: Jul. 14, 2021
Accepted: Aug. 27, 2021
Published Online: Jan. 29, 2022
The Author Email: Zhao Yuejin (yjzhao@bit.edu.cn)