Acta Optica Sinica, Volume. 42, Issue 4, 0411002(2022)

Terahertz Nondestructive Testing Imaging Technology Based on Linear Frequency Modulation Mechanism

Zhenwei Zhang1,2, Yuejin Zhao1、*, Yinxiao Miao3, and Cunlin Zhang2
Author Affiliations
  • 1Beijing Key Laboratory for Precision Optoelectronic Measurement Instrument and Technology, School of Optics and Photonics, Beijing Institute of Technology, Beijing 100081, China
  • 2Key Laboratory of Terahertz Optoelectronics, Beijing Engineering Research Center of Terahertz and Infrared Technology, Beijing Advanced Innovation Center for Imaging Theory and Technology, Department of Physics, Capital Normal University, Beijing 100048, China
  • 3Beijing Aerospace Institute for Metrology and Measurement Technology, Beijing 100076, China
  • show less
    Figures & Tables(11)
    Terahertz frequency modulated continuous wave detection imaging system. (a) Working principle diagram of system; (b) physical map of system; (c) structural diagram of system
    Intensity distribution of focal plane. (a) Before optimization; (b) after optimization
    Photo and terahertz image of sample. (a) Photos of ABS and metal specimen; (b) terahertz C-scan images of ABS and metal specimen
    One-dimensional images before and after correction at different positions. (a) Point S on metal specimen; (b) point A7 on ABS specimen
    Terahertz image of metal specimen. (a) B-scan image at Y=69; (b) three-dimensional image at Y=69; (c) C-scan images at different Z
    Echo signals of S and S1--S9 points on metal specimen
    Echo signals of front and back surfaces at A1--A8 points
    B-scan images of ABS specimen at Y=26 under different reference points. (a) S; (b) S7; (c) S8; (d) 0.3S+0.3S7+0.4S8
    High voltage insulation terminal. (a) Photo of sample; (b) B-scan profile at position with rotation angle of 0°; (c) terahertz echo signals at positions 1, 2, and 3 in Fig. 9(b) when rotation angle is 0°
    Echo signals in range of 0°--360° at different positions. (a)(c) Position 2; (b)(d) position 3
    Reconstructed terahertz three-dimensional images of high voltage insulation terminal from different perspectives. (a) Oblique view; (b) front view
    Tools

    Get Citation

    Copy Citation Text

    Zhenwei Zhang, Yuejin Zhao, Yinxiao Miao, Cunlin Zhang. Terahertz Nondestructive Testing Imaging Technology Based on Linear Frequency Modulation Mechanism[J]. Acta Optica Sinica, 2022, 42(4): 0411002

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: Imaging Systems

    Received: Jul. 14, 2021

    Accepted: Aug. 27, 2021

    Published Online: Jan. 29, 2022

    The Author Email: Zhao Yuejin (yjzhao@bit.edu.cn)

    DOI:10.3788/AOS202242.0411002

    Topics