Acta Optica Sinica, Volume. 30, Issue 8, 2272(2010)
Measuring Inclination and Refractive Index of the Sample in Collection-Mode Scanning Near-Field Optical Microscope with Controllable Illumination
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Wang Zhao, Wu Shifa, Li Hong, Liu Kun. Measuring Inclination and Refractive Index of the Sample in Collection-Mode Scanning Near-Field Optical Microscope with Controllable Illumination[J]. Acta Optica Sinica, 2010, 30(8): 2272
Paper Information
Category: Instrumentation, Measurement and Metrology
Received: Nov. 5, 2009
Accepted: --
Published Online: Aug. 13, 2010
The Author Email: Zhao Wang (wangzhao_1978@yahoo.com.cn)
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