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Acta Optica Sinica, Volume. 30, Issue 8, 2272(2010)

Measuring Inclination and Refractive Index of the Sample in Collection-Mode Scanning Near-Field Optical Microscope with Controllable Illumination

Wang Zhao*, Wu Shifa, Li Hong, and Liu Kun
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    Article index updated: Mar. 10, 2025

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    Wang Zhao, Wu Shifa, Li Hong, Liu Kun. Measuring Inclination and Refractive Index of the Sample in Collection-Mode Scanning Near-Field Optical Microscope with Controllable Illumination[J]. Acta Optica Sinica, 2010, 30(8): 2272

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Nov. 5, 2009

    Accepted: --

    Published Online: Aug. 13, 2010

    The Author Email: Zhao Wang (wangzhao_1978@yahoo.com.cn)

    DOI:10.3788/aos20103008.2272

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology