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Journal of Optoelectronics · Laser, Volume. 35, Issue 8, 822(2024)

Ellipsometric analysis of TiO2 thin films based on different dispersion models

WANG Mengru1, GUAN Yue1, YANG Junying1, SUN Xiaojuan2, and HAN Peigao1、*
Author Affiliations
  • 1School of Physics and Physical Engineering, Qufu Normal University, Qufu, Shandong 273165, China
  • 2School of Geosciences, China University of Petroleum, Qingdao, Shandong 266580, China
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    WANG Mengru, GUAN Yue, YANG Junying, SUN Xiaojuan, HAN Peigao. Ellipsometric analysis of TiO2 thin films based on different dispersion models[J]. Journal of Optoelectronics · Laser, 2024, 35(8): 822

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    Paper Information

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    Received: Dec. 2, 2022

    Accepted: Dec. 13, 2024

    Published Online: Dec. 13, 2024

    The Author Email: HAN Peigao (pghan@foxmail.com)

    DOI:10.16136/j.joel.2024.08.0822

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology