3. SEM images of (a) planar-Si, (b) Si treated with NaOH solution, (c) Bi/Si, (d) BiZn1/Si, (e) BiZn2/Si, and (f) BiZn3/Si with (g-i) elemental mappings of BiZn2/Si
4. (a) XRD patterns of Bi/Si, BiZn1/Si, BiZn2/Si, and BiZn3/Si, and (b) UV-Vis reflectivity spectra of Planar-Si, Si-T, Bi/Si, BiZn1/Si, BiZn2/Si and BiZn3/Si
5. (a) High resolution Bi4f XPS spectra of Bi/Si, BiZn1/Si, BiZn2/Si and BiZn3/Si, (b) ratios of Bi3+/Bi0 for BiZn1/Si, BiZn2/Si, and BiZn3/Si, and (c) high resolution Zn2p XPS spectrum for BiZn2/Si
6. (a) Transient photocurrent curves of Si-T, Bi/Si, BiZn1/Si, BiZn2/Si, and BiZn3/Si, (b) LSV curves of untreated Si (Planar Si), Si-T, Bi/Si, and BiZn2/Si in Ar or CO2-saturated 0.5 mol·L-1 KHCO3 aqueous solution, (c) FE histograms of CO2 reduction productions and (d) HCOOH current densities for Bi/Si, BiZn1/Si, BiZn2/Si, and BiZn3/Si, (e) electrochemical impedance spectra (EIS) of Si-T, Bi/Si and BiZn2/Si, and (f) stability of BiZn2/Si during 10 h test
8. (a) ECSA lines of Bi/Si, BiZn1/Si, BiZn2/Si, and BiZn3/Si, and (b) oxidation LSV curves of PEC and EC CO2 reduction for BiZn2/Si in 0.1 mol·L-1 KOH aqueous solution
S6. 1H NMR spectrum of the liquid phase products of BiZn2/Si in CO2-saturated 0.5 mol·L-1 KOH and Ar-saturated 0.5 mol·L-1 KHCO3 solutions for photoelechemical reduction of CO2