Photonics Research, Volume. 10, Issue 1, 222(2022)

Electrically injected GeSn lasers with peak wavelength up to 2.7 μm On the Cover

Yiyin Zhou1,2, Solomon Ojo1,2, Chen-Wei Wu3, Yuanhao Miao1, Huong Tran1, Joshua M. Grant1,2, Grey Abernathy1,2, Sylvester Amoah1, Jake Bass1, Gregory Salamo4,5, Wei Du6, Guo-En Chang3, Jifeng Liu7, Joe Margetis8, John Tolle8, Yong-Hang Zhang8, Greg Sun9, Richard A. Soref9, Baohua Li10, and Shui-Qing Yu1,5、*
Author Affiliations
  • 1Department of Electrical Engineering, University of Arkansas, Fayetteville, Arkansas 72701, USA
  • 2Microelectronics-Photonics Program, University of Arkansas, Fayetteville, Arkansas 72701, USA
  • 3Department of Mechanical Engineering, Taiwan Chung-Cheng University, Ming-Hsiung, Chiayi 62102, China
  • 4Department of Physics, University of Arkansas, Fayetteville, Arkansas 72701, USA
  • 5Institute for Nanoscience and Engineering, University of Arkansas, Fayetteville, Arkansas 72701, USA
  • 6Department of Electrical Engineering and Physics, Wilkes University, Wilkes-Barre, Pennsylvania 18766, USA
  • 7Thayer School of Engineering, Dartmouth College, Hanover, New Hampshire 03755, USA
  • 8School of Electrical, Energy and Computer Engineering, Arizona State University, Tempe, Arizona 85287, USA
  • 9Department of Electrical Engineering, University of Massachusetts Boston, Boston, Massachusetts 02125, USA
  • 10Arktonics, LLC, Fayetteville, Arkansas 72701, USA
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    Figures & Tables(8)
    (a) 3D schematic of the ridge waveguide laser designed structure; (b) three experiment groups are studied with tuning of the total cap thickness, cap layer material, and active region Sn composition.
    Characterizations of sample E. (a) Temperature-dependent L-I curve. (b) Lasing spectra under injections below and above threshold at 10 K. The PL spectrum was also plotted for comparison. (c) Emission spectra under injections below and above threshold at 90 K; inset: semi-log plot of the spectra.
    L-I curves of each sample at (a) 10 K, (b) 50 K, and (c) 90 K.
    Normalized spectra showing the lasing peaks under 1.1×Jth injection for each sample at the corresponding operational temperatures.
    Calculated metal absorption loss and FCA loss in p-type cap layer for sample A as functions of SiGeSn cap layer total thickness.
    • Table 1. Summary of Laser Structure

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      Table 1. Summary of Laser Structure

      Samplep-type CapGeSn Active Regionn-type Buffer
      MaterialThickness (nm)ΔEc* (meV)Sn Composition (%)Thickness (nm)MaterialThickness (nm)
      ASi0.03Ge0.89Sn0.0819011411.2610Ge0.93Sn0.07950
      BSi0.03Ge0.89Sn0.0815011410.8430Ge0.93Sn0.07670
      CGe0.95Sn0.052205811.2520Ge0.93Sn0.07650
      DGe0.95Sn0.051005811.5450Ge0.93Sn0.07610
      ESi0.03Ge0.89Sn0.0818013113.1540Ge0.93Sn0.07540
    • Table 2. Summary of Laser Characteristicsa

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      Table 2. Summary of Laser Characteristicsa

      SampleCap Layer MaterialCap Layer Thickness (nm)Sn Composition in Active Region (%)Threshold at 10 K (kA/cm2)Threshold at 77 K (kA/cm2)Tmax (K)T0a (K)Lasing Wavelength at 10 K (nm)
      ASi0.03Ge0.89Sn0.08190110.61.4100762238
      BSi0.03Ge0.89Sn0.08150111.4N.A.501192281
      CGe0.95Sn0.05220112.43.1901232294
      DGe0.95Sn0.05100113.4N.A.10N.A.2272
      ESi0.03Ge0.89Sn0.08180131.42.990812654
    • Table 3. Calculated Loss and Threshold at 10 K

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      Table 3. Calculated Loss and Threshold at 10 K

      SampleMetal Absorption Loss (cm1)P-type Cap FCA Loss (cm1)Active Region FCA Loss (cm1)N-type Buffer FCA Loss (cm1)Mirror Loss (cm1)Total Loss (cm1)Threshold at 10 K (kA/cm2)
      A55439383669880.6
      B1287513207816731.4
      C720724439812522.4
      D17243634111821203.4
      E15577075311823991.4
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    Yiyin Zhou, Solomon Ojo, Chen-Wei Wu, Yuanhao Miao, Huong Tran, Joshua M. Grant, Grey Abernathy, Sylvester Amoah, Jake Bass, Gregory Salamo, Wei Du, Guo-En Chang, Jifeng Liu, Joe Margetis, John Tolle, Yong-Hang Zhang, Greg Sun, Richard A. Soref, Baohua Li, Shui-Qing Yu, "Electrically injected GeSn lasers with peak wavelength up to 2.7 μm," Photonics Res. 10, 222 (2022)

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    Paper Information

    Category: Silicon Photonics

    Received: Sep. 14, 2021

    Accepted: Nov. 9, 2021

    Published Online: Dec. 20, 2021

    The Author Email: Shui-Qing Yu (syu@uark.edu)

    DOI:10.1364/PRJ.443144

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