Acta Optica Sinica, Volume. 40, Issue 10, 1031002(2020)

Research on Surface Roughness Related Coating Processes of Mo/Si Multilayers

Shizhuang Sun1,2, Chunshui Jin1、*, Bo Yu1、**, Tao Guo1, Shun Yao1, Chun Li1, and Wenyuan Deng1
Author Affiliations
  • 1Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, Jilin 130033, China
  • 2University of Chinese Academy of Sciences, Beijing 100049, China
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    Figures & Tables(10)
    Schematic of binary collision
    Flow chart of movement calculation of depositing particles
    Schematic of magnetron sputtering atomic deposition
    Cosine of incident angle distributions of Mo and Si atoms. (a)(b) Varying with gas pressure; (c)(d) varying with target-substrate distance
    Incident energy distributions of Mo and Si atoms. (a)(b) Varying with gas pressure; (c)(d) varying with target-substrate distance
    Different surface contours with same roughness value. (a) Low-spatial-frequency; (b) high-spatial-frequency
    Surface contour structures of Mo/Si multilayer coatings measured at different pressures. (a) 0.06 Pa; (b) 0.08 Pa; (c) 0.12 Pa
    Surface roughness of Mo/Si multilayer coatings measured at different gas pressures. (a) Roughness; (b) power spectral density
    Surface contour structures of Mo/Si multilayer coatings measured at different target-substrate distances. (a) 14 cm; (b) 12 cm; (c) 10 cm
    Surface roughness of Mo/Si multilayer coatings measured at different target-substrate distances. (a) Roughness; (b) power spectral density
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    Shizhuang Sun, Chunshui Jin, Bo Yu, Tao Guo, Shun Yao, Chun Li, Wenyuan Deng. Research on Surface Roughness Related Coating Processes of Mo/Si Multilayers[J]. Acta Optica Sinica, 2020, 40(10): 1031002

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    Paper Information

    Category: Thin Films

    Received: Nov. 25, 2019

    Accepted: Feb. 26, 2020

    Published Online: Apr. 28, 2020

    The Author Email: Jin Chunshui (jincs@sklao.ac.cn), Yu Bo (yubodisan@126.com)

    DOI:10.3788/AOS202040.1031002

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