Acta Optica Sinica, Volume. 43, Issue 11, 1134001(2023)
Preparation of X-Ray Fresnel Zone Plate by Atomic Layer Deposition and Focused Ion Beam Slicing
[1] Smith H I. 100 years of x rays: impact on micro- and nanofabrication[J]. Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 13, 2323-2328(1995).
[2] Buonassisi T, Istratov A A, Heuer M et al. Synchrotron-based investigations of the nature and impact of iron contamination in multicrystalline silicon solar cells[J]. Journal of Applied Physics, 97, 074901(2005).
[3] Kirz J, Jacobsen C, Howells M. Soft X-ray microscopes and their biological applications[J]. Quarterly Reviews of Biophysics, 28, 33-130(1995).
[4] Xie H L, Deng B, Du G H et al. Development of X-ray imaging methodology and its applications on material science at Shanghai synchrotron radiation facility[J]. Failure Analysis and Prevention, 16, 46-59, 69(2021).
[5] Sun T X. Capillary X-ray lens technology and its applications[J]. Acta Optica Sinica, 42, 1134002(2022).
[6] Li H C, Huang Q S, Zhu J T et al. Simulation on focusing performance of X-ray multilayer Laue lens for 8 keV X-ray[J]. Acta Optica Sinica, 31, 0834001(2011).
[7] Yan H F, Conley R, Bouet N et al. Hard X-ray nanofocusing by multilayer Laue lenses[J]. Journal of Physics D: Applied Physics, 47, 263001(2014).
[8] Zhu J T, Tu Y C, Li H C et al. X-ray nanometer focusing at the SSRF based on a multilayer Laue lens[J]. Chinese Physics C, 39, 128001(2015).
[9] Ocola L E, Maser J, Vogt S et al. Tapered tilted linear zone plates for focusing hard X-rays[J]. Proceedings of SPIE, 5539, 165-173(2004).
[10] Keskinbora K, Robisch A L, Mayer M et al. Multilayer Fresnel zone plates for high energy radiation resolve 21 nm features at 1.2 keV[J]. Optics Express, 22, 18440-18453(2014).
[11] Wu L J, Wen Q T, Gao Y Z et al. Investigation on the preparation of high precision multilayer X-ray Fresnel zone plates based on atomic layer deposition technology[J]. Acta Photonica Sinica, 50, 0123001(2021).
[12] Gao Y Z, Wu L J, Lu W E et al. Design of hard X-ray Fresnel zone plates based on rigorous coupled wave theory[J]. Acta Optica Sinica, 41, 1111002(2021).
[13] Maser J. Evaluation of the efficiency of zone plates with high aspect ratios by application of coupled wave theory[M]. Michette A G, Morrison G R, Buckley C J. X-ray microscopy III. Springer series in optical sciences, 67, 104-106(1992).
[14] Rehbein S, Heim S, Guttmann P et al. Ultrahigh-resolution soft-x-ray microscopy with zone plates in high orders of diffraction[J]. Physical Review Letters, 103, 110801(2009).
[15] Fu S J, Hong Y L, Tao X M et al. Fabrication of soft X-ray condenser zone plates[J]. Acta Optica Sinica, 15, 1148-1150(1995).
[16] Li H L, Shi L N, Niu J B et al. Fabrication and focusing test of hard X-ray zone plates with high aspect ratio[J]. Optics and Precision Engineering, 25, 2803-2809(2017).
[17] Wang D Q, Cao L F, Xie C Q et al. Fabrication of micro zone plates by E-beam and X-ray lithography[J]. Chinese Journal of Semiconductors, 27, 1147-1150(2006).
[18] Chen Y F. Fabrication of diffractive X-ray optics and their performance characterization[J]. Optics and Precision Engineering, 25, 2779-2795(2017).
[19] Chen Y F. Recent progress in nanofabrication of high resolution X-ray zone plate lenses by electron beam lithography[J]. Acta Optica Sinica, 42, 1134005(2022).
[20] Chao W L, Kim J, Rekawa S et al. Demonstration of 12 nm resolution Fresnel zone plate lens based soft X-ray microscopy[J]. Optics Express, 17, 17669-17677(2009).
[21] Moldovan N, Divan R, Zeng H J et al. Atomic layer deposition frequency-multiplied Fresnel zone plates for hard X-rays focusing[J]. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 36, 01A124(2018).
[22] Tamura S, Yasumoto M, Mihara T et al. Multilayer Fresnel zone plate for high-energy X-ray by DC sputtering deposition[J]. Vacuum, 66, 495-499(2002).
[23] Düvel A, Rudolph D, Schmahl G. Fabrication of thick zone plates for multi-kilovolt X-rays[C], 507, 607-614(2000).
[24] Takano H, Sumida K, Hirotomo H et al. Hard X-ray multilayer zone plate with 25-nm outermost zone width[J]. Journal of Physics: Conference Series, 849, 012052(2017).
[25] Tamura S, Yasumoto M, Kamijo N et al. Development of a multilayer Fresnel zone plate for high-energy synchrotron radiation X-rays by DC sputtering deposition[J]. Journal of Synchrotron Radiation, 9, 154-159(2002).
[26] Eberl C, Döring F, Liese T et al. Fabrication of laser deposited high-quality multilayer zone plates for hard X-ray nanofocusing[J]. Applied Surface Science, 307, 638-644(2014).
[27] Sanli U T, Jiao C G, Baluktsian M et al. 3D nanofabrication of high-resolution multilayer Fresnel zone plates[J]. Advanced Science, 5, 1800346(2018).
[28] Mayer M, Keskinbora K, Grévent C et al. Efficient focusing of 8 keV X-rays with multilayer Fresnel zone plates fabricated by atomic layer deposition and focused ion beam milling[J]. Journal of Synchrotron Radiation, 20, 433-440(2013).
[29] Keskinbora K, Robisch A L, Mayer M et al. Recent advances in use of atomic layer deposition and focused ion beams for fabrication of Fresnel zone plates for hard x-rays[J]. Proceedings of SPIE, 8851, 885119(2013).
[30] Kamijo N, Suzuki Y, Takano H et al. Microbeam of 100 keV x ray with a sputtered-sliced Fresnel zone plate[J]. Review of Scientific Instruments, 74, 5101-5104(2003).
[31] Pommet D A, Moharam M G, Grann E B. Limits of scalar diffraction theory for diffractive phase elements[J]. Journal of the Optical Society of America A, 11, 1827-1834(1994).
[32] Zhang L J, Xu Z J, Zhang X Z et al. Latest advances in soft X-ray spectromicroscopy at SSRF[J]. Nuclear Science and Techniques, 26, 3-13(2015).
Get Citation
Copy Citation Text
Mingsheng Tan, Shuaiqiang Ming, Yufei Wu, Weier Lu, Yanli Li, Xiangdong Kong, Haigang Liu, Yang Xia, Li Han. Preparation of X-Ray Fresnel Zone Plate by Atomic Layer Deposition and Focused Ion Beam Slicing[J]. Acta Optica Sinica, 2023, 43(11): 1134001
Category: X-Ray Optics
Received: Nov. 25, 2022
Accepted: Feb. 21, 2023
Published Online: May. 29, 2023
The Author Email: Lu Weier (luweier@ime.ac.cn), Li Yanli (liyanli@mail.iee.ac.cn), Kong Xiangdong (slkongxd@mail.iee.ac.cn)