Laser & Infrared, Volume. 55, Issue 6, 905(2025)

Research on infrared focal plane chip flip-chip interconnect process inspection and application

OUYANG Tian, LIU Ming, FENG Xiao-yu, and NING Ti
Author Affiliations
  • The 11th Research Institute of CETC, Beijing 100015, China
  • show less
    Figures & Tables(0)
    Tools

    Get Citation

    Copy Citation Text

    OUYANG Tian, LIU Ming, FENG Xiao-yu, NING Ti. Research on infrared focal plane chip flip-chip interconnect process inspection and application[J]. Laser & Infrared, 2025, 55(6): 905

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category:

    Received: Aug. 9, 2024

    Accepted: Jul. 30, 2025

    Published Online: Jul. 30, 2025

    The Author Email:

    DOI:10.3969/j.issn.1001-5078.2025.06.011

    Topics