Acta Optica Sinica, Volume. 34, Issue 5, 531002(2014)
Optical Constants and Properties of Dual-Ion-Beam Sputtering Ta2O5/SiO2 Thin Film by Spectroscopy
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Shang Peng, Xiong Shengming, Li Linghui, Tian Dong. Optical Constants and Properties of Dual-Ion-Beam Sputtering Ta2O5/SiO2 Thin Film by Spectroscopy[J]. Acta Optica Sinica, 2014, 34(5): 531002
Paper Information
Category: Thin Films
Received: Dec. 9, 2013
Accepted: --
Published Online: Apr. 22, 2014
The Author Email: Peng Shang (shangpeng@163.com)
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