Chinese Optics Letters, Volume. 22, Issue 1, 011202(2024)
New speckle pattern interferometry for precise in situ deformation measurements
Fig. 2. (a) Close-up view of the test object; (b) schematic diagram of the spatial arrangement of the LDVs; (c) plane view of the test object.
Fig. 3. (a) Interferograms before deformation and after deformation and (b) out-of-plane displacement caused by the vibrations recorded by the LDVs.
Fig. 4. Phase-shifted planes obtained by fitting the data measured by the LDVs at different times.
Fig. 5. (a) Deformation phase obtained by the four-step phase-shifting method; (b) deformation phase obtained by the proposed method; (c) calculation errors of these two methods; (d) data from the cross sections in panels (a)–(c).
Fig. 6. (a) 3D plot and (b) 2D plot at the deformation time t = 3 s; (c) errors of the static measurements and dynamic measurements.
Fig. 7. (a) Deformations at cross section L at different instants and (b) transient deformations of points A, B, and C.
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Ruyue Zhang, Yu Fu, Hong Miao, "New speckle pattern interferometry for precise in situ deformation measurements," Chin. Opt. Lett. 22, 011202 (2024)
Category: Instrumentation, Measurement, and Optical Sensing
Received: Jul. 5, 2023
Accepted: Aug. 31, 2023
Published Online: Jan. 9, 2024
The Author Email: Hong Miao (miaohong@ustc.edu.cn)