Chinese Optics Letters, Volume. 22, Issue 1, 011202(2024)
New speckle pattern interferometry for precise in situ deformation measurements
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Ruyue Zhang, Yu Fu, Hong Miao, "New speckle pattern interferometry for precise in situ deformation measurements," Chin. Opt. Lett. 22, 011202 (2024)
Category: Instrumentation, Measurement, and Optical Sensing
Received: Jul. 5, 2023
Accepted: Aug. 31, 2023
Published Online: Jan. 9, 2024
The Author Email: Hong Miao (miaohong@ustc.edu.cn)