Infrared Defect Emission and Thermal Effect in High Power Diode Lasers

Fangyu Yue; Feng Mao; Han Wang; Xiaoling Zhang; Ye Chen; Chengbin Jing; Junhao Chu

doi:10.3788/LOP56.110001

Laser & Optoelectronics Progress, Volume. 56, Issue 11, 110001(2019)

Infrared Defect Emission and Thermal Effect in High Power Diode Lasers

Fangyu Yue^1、*, Feng Mao¹, Han Wang¹, Xiaoling Zhang¹, Ye Chen¹, Chengbin Jing¹, and Junhao Chu^1,2

¹ Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Optoelectronics, School of Information Science Technology, East China Normal University, Shanghai 200241, China

² National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China

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Fangyu Yue, Feng Mao, Han Wang, Xiaoling Zhang, Ye Chen, Chengbin Jing, Junhao Chu. Infrared Defect Emission and Thermal Effect in High Power Diode Lasers[J]. Laser & Optoelectronics Progress, 2019, 56(11): 110001

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Paper Information

Category: Reviews

Received: Nov. 19, 2018

Accepted: Dec. 25, 2018

Published Online: Jun. 13, 2019

The Author Email: Fangyu Yue (fyyue@ee.ecnu.edu.cn)

DOI:10.3788/LOP56.110001

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology