Chinese Journal of Lasers, Volume. 38, Issue 8, 806001(2011)

Mathematical Model of Aging and the Life Test Method for GaN LED

Yu Fei* and Jin Lei
Author Affiliations
  • [in Chinese]
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    References(13)

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    CLP Journals

    [1] Liu Yun, Zhao Shanghong, Yang Shengsheng, Li Yongjun, Qiang Ruoxin. Accelerated Life Testing Model of Laser Diodes under Space Radiation Stress[J]. Chinese Journal of Lasers, 2014, 41(5): 502001

    [2] Qian Minhua, Lin Yandan, Sun Yaojie. Life Prediction Model for LEDs Based on the Photo-Electro-Thermal-Life Theory[J]. Acta Optica Sinica, 2012, 32(8): 823001

    [3] Wang Haiyan, Zhang Yating, Jin Lufan, Song Xiaoxian, Yao Jianquan. Acceleration Aging Study of Amplified Spontaneous Emission Broadband Source[J]. Chinese Journal of Lasers, 2015, 42(4): 405003

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    Paper Information

    Category: materials and thin films

    Received: Feb. 17, 2011

    Accepted: --

    Published Online: Jul. 19, 2011

    The Author Email: Fei Yu (fei.yu@sub.siat.ac.cn)

    DOI:10.3788/cjl201138.0806001

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