Chinese Journal of Lasers, Volume. 38, Issue 8, 806001(2011)
Mathematical Model of Aging and the Life Test Method for GaN LED
[1] [1] Liu Xingren. The fluorophor of light transforming in solid-state white light LEDs[J]. Chinese J. Luminescence, 2007, 28(3): 291~301
[2] [2] Zhu Zhenmin, Qu Xinghua, Liang Haiyu et al.. Uniform illumination study by light-emitting diode ring array and diffuse reflection surface[J]. Acta Optica Sinica, 2011, 31(1): 0115001
[4] [4] Zhang Guoyi, Chen Zhizhong. The basis of solid state lighting——GaN white light emitting diodes[J]. Physics, 2004, 33(11): 833~842
[6] [6] Peng Jie. The major problem of high power LED application[J]. Light Source and Lighting, 2004, (3): 4~7
[7] [7] Chen Huanting, Lü Yijun, Chen Zhong et al.. The analysis of the aging mechanism of GaN blue-ray LED based on capacitance and electrical properties[J]. Acta Physica Sinica, 2009, 58(8): 5070~5074
[8] [8] F. Manyakhin, A. Kovalev, A. E. Yunovich. Aging mechanisms of InGaN/AlGaN/GaN light-emitting diodes operating at high currents[J]. MRS Internet J. Nitride Semiconductor Research, 1998, 53(3): 1~6
[9] [9] Zheng Daishun, Qian Keyuan, Luo Yi. Life test and failure mechanism analyses for high power LED high power LED[J]. Semiconductor Optoelectronic, 2005, 26(2): 87~127
[10] [10] Liu Xijuan, Wen Yan, Zhu Shaolong. The definition of the life of white LED and testing methods[J]. J. Light Source and Lighting, 2001, (4): 16~22
[11] [11] Chen Zhizhong, Qin Zhixin, Hu Xiaodong et al.. The preparation and characterization of high power white LED[J]. Liquid Crystal Display, 2004, 19(2): 83~86
[12] [12] S. Ishizaki, H. Kimura, M. Sugimoto. Lifetime estimation of high power white LEDs[J]. J. Light & Vis. Env., 2007, 31(1): 11~18
[13] [13] Chen Yubin. The Aging Mechanism Research of White LEDs [D]. Guangzhou: South China Normal University, 2007. 44~52
Get Citation
Copy Citation Text
Yu Fei, Jin Lei. Mathematical Model of Aging and the Life Test Method for GaN LED[J]. Chinese Journal of Lasers, 2011, 38(8): 806001
Category: materials and thin films
Received: Feb. 17, 2011
Accepted: --
Published Online: Jul. 19, 2011
The Author Email: Fei Yu (fei.yu@sub.siat.ac.cn)