Chinese Journal of Lasers, Volume. 38, Issue 8, 806001(2011)
Mathematical Model of Aging and the Life Test Method for GaN LED
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Yu Fei, Jin Lei. Mathematical Model of Aging and the Life Test Method for GaN LED[J]. Chinese Journal of Lasers, 2011, 38(8): 806001
Paper Information
Category: materials and thin films
Received: Feb. 17, 2011
Accepted: --
Published Online: Jul. 19, 2011
The Author Email: Fei Yu (fei.yu@sub.siat.ac.cn)
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