Chinese Journal of Lasers, Volume. 49, Issue 17, 1704004(2022)

Development of Measurement System of Refrigerant Film Thickness Based on Absorption Spectroscopy

Shuaishuai Kong, Xiaoyan Xu, Hao Sun, Yidong Fang, Mingxu Su, and Huinan Yang*
Author Affiliations
  • School of Energy and Power Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China
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    Shuaishuai Kong, Xiaoyan Xu, Hao Sun, Yidong Fang, Mingxu Su, Huinan Yang. Development of Measurement System of Refrigerant Film Thickness Based on Absorption Spectroscopy[J]. Chinese Journal of Lasers, 2022, 49(17): 1704004

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    Paper Information

    Category: Measurement and metrology

    Received: Dec. 6, 2021

    Accepted: Jan. 6, 2022

    Published Online: Jul. 28, 2022

    The Author Email: Yang Huinan (yanghuinan@usst.edu.cn)

    DOI:10.3788/CJL202249.1704004

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