Chinese Journal of Lasers, Volume. 49, Issue 17, 1704004(2022)
Development of Measurement System of Refrigerant Film Thickness Based on Absorption Spectroscopy
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Shuaishuai Kong, Xiaoyan Xu, Hao Sun, Yidong Fang, Mingxu Su, Huinan Yang. Development of Measurement System of Refrigerant Film Thickness Based on Absorption Spectroscopy[J]. Chinese Journal of Lasers, 2022, 49(17): 1704004
Category: Measurement and metrology
Received: Dec. 6, 2021
Accepted: Jan. 6, 2022
Published Online: Jul. 28, 2022
The Author Email: Yang Huinan (yanghuinan@usst.edu.cn)