Chinese Journal of Lasers, Volume. 49, Issue 17, 1704004(2022)
Development of Measurement System of Refrigerant Film Thickness Based on Absorption Spectroscopy
Fig. 2. Absorption spectra of R1233zd at different temperatures in near infrared range
Fig. 4. Measurement results of film thicknesses. (a) Comparison of measured and known film thicknesses;(b) standard deviation of film thickness
Fig. 5. Experimental setup for investigating R1233zd film evaporation process on quartz plate
Fig. 7. Processed images at six specific moments during liquid film evaporation process by imaging method
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Shuaishuai Kong, Xiaoyan Xu, Hao Sun, Yidong Fang, Mingxu Su, Huinan Yang. Development of Measurement System of Refrigerant Film Thickness Based on Absorption Spectroscopy[J]. Chinese Journal of Lasers, 2022, 49(17): 1704004
Category: Measurement and metrology
Received: Dec. 6, 2021
Accepted: Jan. 6, 2022
Published Online: Jul. 28, 2022
The Author Email: Yang Huinan (yanghuinan@usst.edu.cn)