Chinese Journal of Lasers, Volume. 49, Issue 17, 1704004(2022)

Development of Measurement System of Refrigerant Film Thickness Based on Absorption Spectroscopy

Shuaishuai Kong, Xiaoyan Xu, Hao Sun, Yidong Fang, Mingxu Su, and Huinan Yang*
Author Affiliations
  • School of Energy and Power Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China
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    Figures & Tables(7)
    Homemade temperature control device
    Absorption spectra of R1233zd at different temperatures in near infrared range
    Developed measurement system based on absorption spectroscopy
    Measurement results of film thicknesses. (a) Comparison of measured and known film thicknesses;(b) standard deviation of film thickness
    Experimental setup for investigating R1233zd film evaporation process on quartz plate
    Thickness versus time during evaporation process of R1233zd films
    Processed images at six specific moments during liquid film evaporation process by imaging method
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    Shuaishuai Kong, Xiaoyan Xu, Hao Sun, Yidong Fang, Mingxu Su, Huinan Yang. Development of Measurement System of Refrigerant Film Thickness Based on Absorption Spectroscopy[J]. Chinese Journal of Lasers, 2022, 49(17): 1704004

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    Paper Information

    Category: Measurement and metrology

    Received: Dec. 6, 2021

    Accepted: Jan. 6, 2022

    Published Online: Jul. 28, 2022

    The Author Email: Yang Huinan (yanghuinan@usst.edu.cn)

    DOI:10.3788/CJL202249.1704004

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