Chinese Journal of Lasers, Volume. 51, Issue 8, 0811003(2024)
Spectral Reduction Algorithm for Echelle Spectrometer Based on Full‐Field Fitting
Fig. 2. Two dimensional spectral model. (a) Schematic of two-dimensional spectrum in free spectral range[9]; (b) schematic of two-dimensional spectrum of Hg-Ar lamp
Fig. 3. Schematics of spectrum reconstruction process. (a) Original spectrum; (b) spectrum reconstruction model[26]; (c) one-dimensional spectrum
Fig. 5. Schematics of deviation method[11]. (a) Actual optical path diagram; (b) optical path diagram of equivalent model
Fig. 7. Programming software curves. (a) Curve of sampling points in X-direction; (b) curve of sampling points in Y-direction
Fig. 8. Fitting error curves. (a) Error after linear fitting in Y-direction; (b) error after quadratic fitting in X-direction; (c) error after cubic fitting in X-direction; (d) error after fourth-order fitting in X-direction
Fig. 9. Mercury-argon lamp spectrum taken in laboratory with selected 9 characteristic wavelength points marked by boxes
Fig. 10. Error curves before and after fitting. (a) Error curves before fitting; (b) error curves after fitting
Fig. 11. Original two-dimensional images. (a) Bright spots of effective light spot; (b) bright spots of background noise
Fig. 13. Local two-dimensional spectra of mercury-argon lamp. (a) Local spectrum before denoising; (b) local spectrum after denoising
Fig. 14. Schematics of false peaks during extracting. (a) Schematic of adjacent levels in long wavelength band; (b) schematic of fake peak
Fig. 15. One-dimensional spectrum of characteristic wavelength and light intensity
Fig. 16. Pixel deviations of characteristic wavelengths in different wavelength bands. (a) Pixel deviation in 200‒300 nm wavelength band; (b) pixel deviation in 300‒500 nm wavelength band; (c) pixel deviation in 500‒600 nm wavelength band; (d) pixel deviation in 600‒800 nm wavelength band
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Tao Cui, Lu Yin, Yanan Sun, Jianjun Chen, Yangdong Zhou, Longfei Han, Le Wang. Spectral Reduction Algorithm for Echelle Spectrometer Based on Full‐Field Fitting[J]. Chinese Journal of Lasers, 2024, 51(8): 0811003
Category: spectroscopy
Received: Dec. 1, 2023
Accepted: Jan. 16, 2024
Published Online: Apr. 11, 2024
The Author Email: Yin Lu (yinlu890622@163.com), Wang Le (calla@cjlu.edu.cn)
CSTR:32183.14.CJL231469