Spectral Reduction Algorithm for Echelle Spectrometer Based on Full‐Field Fitting

Tao Cui; Lu Yin; Yanan Sun; Jianjun Chen; Yangdong Zhou; Longfei Han; Le Wang

doi:10.3788/CJL231469

Chinese Journal of Lasers, Volume. 51, Issue 8, 0811003(2024)

Spectral Reduction Algorithm for Echelle Spectrometer Based on Full‐Field Fitting

Tao Cui¹, Lu Yin^1、*, Yanan Sun¹, Jianjun Chen², Yangdong Zhou¹, Longfei Han¹, and Le Wang^1、**

Author Affiliations

¹College of Optics and Electronic Science and Technology, China Jiliang University, Hangzhou 310018, Zhejiang, China

²College of Information and Control Engineering, Qingdao University of Technology, Qingdao 266520, Shandong, China

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Tao Cui, Lu Yin, Yanan Sun, Jianjun Chen, Yangdong Zhou, Longfei Han, Le Wang. Spectral Reduction Algorithm for Echelle Spectrometer Based on Full‐Field Fitting[J]. Chinese Journal of Lasers, 2024, 51(8): 0811003

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Paper Information

Category: spectroscopy

Received: Dec. 1, 2023

Accepted: Jan. 16, 2024

Published Online: Apr. 11, 2024

The Author Email: Yin Lu (yinlu890622@163.com), Wang Le (calla@cjlu.edu.cn)

DOI:10.3788/CJL231469

CSTR:32183.14.CJL231469

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology