Acta Optica Sinica, Volume. 42, Issue 15, 1512003(2022)
Fast Vertical Scanning Topography Measurement Based on Spectral Distribution Characteristics
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Juntao Zhou, Zhishan Gao, Yifeng Sun, Jianqiu Ma, Pengfei Xie, Jiale Zhang, Zhenyan Guo, Qun Yuan. Fast Vertical Scanning Topography Measurement Based on Spectral Distribution Characteristics[J]. Acta Optica Sinica, 2022, 42(15): 1512003
Category: Instrumentation, Measurement and Metrology
Received: Jan. 10, 2022
Accepted: Mar. 3, 2022
Published Online: Aug. 4, 2022
The Author Email: Qun Yuan (yuanqun@njust.edu.cn)