Laser & Optoelectronics Progress, Volume. 61, Issue 14, 1412003(2024)

Three-Dimensional Microscopic Measurement Based on Gradient Variance for Focus Evaluation

Zhengqiong Dong, Qingfeng Yang, Xianwen Huang, Jingyi Wang, Yijun Xie, Renlong Zhu, Xiangdong Zhou, and Lei Nie*
Author Affiliations
  • Hubei Key Laboratory of Modern Manufacture Quality Engineering, School of Mechanical Engineering, Hubei University of Technology, Wuhan 430068, Hubei , China
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    Figures & Tables(9)
    Principle of focused microscopic measurement. (a) Imaging principle; (b) image sequence
    Experimental platform
    Standard step sample block
    Comparison of focus evaluation curves
    Results of the step reconstruction
    Results of M4 bolt reconstruction
    • Table 1. Quantitative evaluation indicators

      View table

      Table 1. Quantitative evaluation indicators

      FunctionRfsen
      Brenner0.530468.41
      Rob_SMD0.9122118.37
      Tenengrad0.174321.81
      Bren3_Rob2.3540307.04
      Laplace0.449157.77
      Proposed method2.4412318.45
    • Table 2. Height measurement results

      View table

      Table 2. Height measurement results

      FunctionDepth /mmError /%
      Brenner0.98781.22
      Rob_SMD0.98991.01
      Tenengrad0.98791.21
      Bren3_Rob0.99170.83
      Laplace0.98891.11
      Proposed method0.99510.49
    • Table 3. Multiple height measurement results of the proposed method

      View table

      Table 3. Multiple height measurement results of the proposed method

      Measurement No.Depth /mmError /μm
      Average value1.002402.40
      11.002492.49
      21.002302.30
      31.002412.41
      41.002452.45
      51.002322.32

      6

      7

      8

      1.00242

      1.00237

      1.00244

      2.42

      2.37

      2.44

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    Zhengqiong Dong, Qingfeng Yang, Xianwen Huang, Jingyi Wang, Yijun Xie, Renlong Zhu, Xiangdong Zhou, Lei Nie. Three-Dimensional Microscopic Measurement Based on Gradient Variance for Focus Evaluation[J]. Laser & Optoelectronics Progress, 2024, 61(14): 1412003

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Sep. 4, 2023

    Accepted: Dec. 14, 2023

    Published Online: Jul. 17, 2024

    The Author Email: Lei Nie (leinie@hbut.edu.cn)

    DOI:10.3788/LOP232028

    CSTR:32186.14.LOP232028

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