Three-Dimensional Microscopic Measurement Based on Gradient Variance for Focus Evaluation

Zhengqiong Dong; Qingfeng Yang; Xianwen Huang; Jingyi Wang; Yijun Xie; Renlong Zhu; Xiangdong Zhou; Lei Nie

doi:10.3788/LOP232028

Laser & Optoelectronics Progress, Volume. 61, Issue 14, 1412003(2024)

Three-Dimensional Microscopic Measurement Based on Gradient Variance for Focus Evaluation

Zhengqiong Dong, Qingfeng Yang, Xianwen Huang, Jingyi Wang, Yijun Xie, Renlong Zhu, Xiangdong Zhou, and Lei Nie^*

Hubei Key Laboratory of Modern Manufacture Quality Engineering, School of Mechanical Engineering, Hubei University of Technology, Wuhan 430068, Hubei , China

show less

Abstract Get PDF(in Chinese)

Cited By

Article index updated: Sep. 10, 2025

The article is cited by 1 article(s) CLP online library. (Some content might be in Chinese.)

Tools

Get Citation

Copy Citation Text

Zhengqiong Dong, Qingfeng Yang, Xianwen Huang, Jingyi Wang, Yijun Xie, Renlong Zhu, Xiangdong Zhou, Lei Nie. Three-Dimensional Microscopic Measurement Based on Gradient Variance for Focus Evaluation[J]. Laser & Optoelectronics Progress, 2024, 61(14): 1412003

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites

Paper Information

Category: Instrumentation, Measurement and Metrology

Received: Sep. 4, 2023

Accepted: Dec. 14, 2023

Published Online: Jul. 17, 2024

The Author Email: Lei Nie (leinie@hbut.edu.cn)

DOI:10.3788/LOP232028

CSTR:32186.14.LOP232028

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology