Fig. 1. Schematic conduction band diagrams for: (a) Device I; (b) Device II, in which the distributions of polarization-induced interface sheet charges and the polarization-induced bulk charges are also shown. Ec represents the conduction band.

Fig. 2. (a) Electric field profiles, (b) combined conduction band profiles, and (c) combined valence band profiles for Devices I and II. Data are collected at 30A/cm2. Δφe and Δφh are both 14.75 meV.

Fig. 3. (a) Calculated and (b) measured EL spectra for Devices I and II at the currents of 6A/cm2 and 30A/cm2, respectively.

Fig. 4. (a) Numerically computed and (b) experimentally measured light output power and peak emission wavelengths in terms of the current injection levels. Inset for Fig. 4(a) presents the calculated electron-hole overlap level in QW2 at different injection current density levels.

Fig. 5. (a) Hole concentration profiles and (b) electron concentration profiles in the MQWs for Devices I and II at the current level of 30A/cm2. Inset for Fig. 5(b) shows the normalized electron current density for Devices I and II at the current level of 30A/cm2.

Fig. 6. (a) Numerically computed light output power and (b) normalized electron current density for Devices I, II, and III. The electron current density is collected at 30A/cm2.