On the polarization self-screening effect in multiple quantum wells for nitride-based near ultraviolet light-emitting diodes

Kangkai Tian; Chunshuang Chu; Jiamang Che; Hua Shao; Jianquan Kou; Yonghui Zhang; Zi-Hui Zhang; Tongbo Wei

doi:10.3788/COL201917.122301

Chinese Optics Letters, Volume. 17, Issue 12, 122301(2019)

On the polarization self-screening effect in multiple quantum wells for nitride-based near ultraviolet light-emitting diodes

Kangkai Tian^1,2, Chunshuang Chu^1,2, Jiamang Che^1,2, Hua Shao^1,2, Jianquan Kou^1,2, Yonghui Zhang^1,2, Zi-Hui Zhang^1,2、*, and Tongbo Wei^3、**

Author Affiliations

¹Institute of Micro-Nano Photoelectron and Electromagnetic Technology Innovation, School of Electronics and Information Engineering, Hebei University of Technology, Tianjin 300401, China

²Key Laboratory of Electronic Materials and Devices of Tianjin, Tianjin 300401, China

³State Key Laboratory of Solid-State Lighting, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China

show less

Cited By

Article index updated: Nov. 8, 2024

Citation counts are provided from Web of Science. The counts may vary by service, and are reliant on the availability of their data.

The article is cited by 5 article(s) from Web of Science.

Tools

Get Citation

Copy Citation Text

Kangkai Tian, Chunshuang Chu, Jiamang Che, Hua Shao, Jianquan Kou, Yonghui Zhang, Zi-Hui Zhang, Tongbo Wei, "On the polarization self-screening effect in multiple quantum wells for nitride-based near ultraviolet light-emitting diodes," Chin. Opt. Lett. 17, 122301 (2019)

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites

Paper Information

Category: Optical devices

Received: Apr. 29, 2019

Accepted: Aug. 30, 2019

Posted: Sep. 3, 2019

Published Online: Dec. 5, 2019

The Author Email: Zi-Hui Zhang (zh.zhang@hebut.edu.cn), Tongbo Wei (tbwei@semi.ac.cn)

DOI:10.3788/COL201917.122301

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology