Matter and Radiation at Extremes, Volume. 10, Issue 3, 033802(2025)
High-pressure research on optoelectronic materials: Insights from in situ characterization methods
[30] A. C.Larson, R. B.Von Dreele. GSAS: General Structure Analysis System Report LAUR(1986).
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Songhao Guo, Yiqiang Zhan, Xujie Lü. High-pressure research on optoelectronic materials: Insights from in situ characterization methods[J]. Matter and Radiation at Extremes, 2025, 10(3): 033802
Received: Jan. 16, 2025
Accepted: Apr. 11, 2025
Published Online: Jul. 16, 2025
The Author Email: Songhao Guo (sh_guo@fudan.edu.cn)