Chinese Optics, Volume. 12, Issue 6, 1195(2019)
Spectroscopic ellipsometry and its applications in the study of thin film materials
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ZHU Xu-dan, ZHANG Rong-jun, ZHENG Yu-xiang, WANG Song-you, CHEN Liang-yao. Spectroscopic ellipsometry and its applications in the study of thin film materials[J]. Chinese Optics, 2019, 12(6): 1195
Paper Information
Category: reviews
Received: Jul. 4, 2018
Accepted: --
Published Online: Jan. 19, 2020
The Author Email: ZHU Xu-dan (19110720016@fudan.edu.cn)
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