Journal of Infrared and Millimeter Waves, Volume. 41, Issue 5, 888(2022)

On-site determination of optical constants for thin films

Mao-Bin XIE1...3,4,5, Zhi-Yong WU1,2,3, Heng-Yi CUI1,3,4,5, Xin-Chao ZHAO1,3,4,5, Zhi-Yi XUAN1,4,5,6, Qing-Quan LIU1,4,5,6, Feng LIU2,*, Liao-Xin SUN1,3,5, and Shao-Wei WANG1,3,4,57,** |Show fewer author(s)
Author Affiliations
  • 1State Key Laboratory of Infrared Physics,Shanghai Institute of Technical Physics,Chinese Academy of Sciences,Shanghai 200083,China
  • 2Department of Physics,Shanghai Normal University,Shanghai 200234,China
  • 3Shanghai Engineering Research Center of Energy-Saving Coatings,Shanghai 200083,China
  • 4Shanghai Research Center for Quantum Sciences,Shanghai 201315,China
  • 5University of Chinese Academy of Sciences,Beijing 100049,China
  • 6School of Physical Science and Technology,ShanghaiTech University,Shanghai 201210,China
  • 7Nantong Academy of Intelligent Sensing,Nantong 226000,China
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    Mao-Bin XIE, Zhi-Yong WU, Heng-Yi CUI, Xin-Chao ZHAO, Zhi-Yi XUAN, Qing-Quan LIU, Feng LIU, Liao-Xin SUN, Shao-Wei WANG. On-site determination of optical constants for thin films[J]. Journal of Infrared and Millimeter Waves, 2022, 41(5): 888

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    Paper Information

    Category: Research Articles

    Received: Jul. 19, 2021

    Accepted: --

    Published Online: Feb. 6, 2023

    The Author Email: Feng LIU (fliu@shnu.edu.cn), Shao-Wei WANG (wangshw@mail.sitp.ac.cn)

    DOI:10.11972/j.issn.1001-9014.2022.05.013

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