Laser & Optoelectronics Progress, Volume. 57, Issue 5, 053001(2020)

Structure Analysis and Experiment of an Offner-Type Short-Wave Infrared Imaging Spectrometer

Zhizhong Zheng1,3、*, Zhong Yang1, Yuantian Qin2, and Liguo Wang2
Author Affiliations
  • 1College of Automation Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing, Jiangsu 211100, China
  • 2College of Aeronautics, Nanjing University of Aeronautics and Astronautics, Nanjing, Jiangsu 210016, China
  • 3Nanjing Geological Survey Center, China Geological Survey, Nanjing, Jiangsu 210016, China
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    References(10)

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    [2] Wang J Y, Shu R, Liu Y N[M]. Introduction to imaging spectroscopy(2011).

    [4] Liu W. Design and analysis of structure of compact Offner spectral imaging system[J]. Chinese Optics and Applied Optics Abstracts, 3, 157-163(2010).

    [6] Zhang J Q, Dong D Y, Wu Q W et al. Treatment of surface figure error and rigid body motion for mirror/lens in optical remote senor[J]. Chinese Journal of Scientific Instrument, 32, 242-247(2011).

    [7] Ji Y Q, Chen Y H, Liu Q et al. Convex grating imaging spectrograph with light weight and high fidelity[J]. Proceedings of SPIE, 7156, 71560K(2009).

    [8] Wang D, Yang H B. Computer simulation of the optical surface[J]. Computer Simulation, 24, 298-301(2007).

    [9] Michels G J, Genberg V L. Analysis of thermally loaded transmissive optical elements[J]. Proceedings of SPIE, 8127, 81270K(2011).

    [10] Michels G J, Genberg V L, Doyle K B. Finite element modeling of nearly incompressible bonds[J]. Proceedings of SPIE, 4771, 287-295(2002).

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    Zhizhong Zheng, Zhong Yang, Yuantian Qin, Liguo Wang. Structure Analysis and Experiment of an Offner-Type Short-Wave Infrared Imaging Spectrometer[J]. Laser & Optoelectronics Progress, 2020, 57(5): 053001

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    Paper Information

    Category: Spectroscopy

    Received: Aug. 5, 2019

    Accepted: Aug. 27, 2019

    Published Online: Mar. 5, 2020

    The Author Email: Zhizhong Zheng (zhengzz_js@126.com)

    DOI:10.3788/LOP57.053001

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