Laser & Optoelectronics Progress, Volume. 57, Issue 5, 053001(2020)
Structure Analysis and Experiment of an Offner-Type Short-Wave Infrared Imaging Spectrometer
Zhizhong Zheng1,3、*, Zhong Yang1, Yuantian Qin2, and Liguo Wang2
Author Affiliations
1College of Automation Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing, Jiangsu 211100, China2College of Aeronautics, Nanjing University of Aeronautics and Astronautics, Nanjing, Jiangsu 210016, China3Nanjing Geological Survey Center, China Geological Survey, Nanjing, Jiangsu 210016, Chinashow less