Chinese Journal of Lasers, Volume. 46, Issue 9, 904001(2019)
Assembly Error Tolerance of Interferometer Plate in Mirau Interference-Microscope Objective
Fig. 1. Interferometric imaging optical path of white light interferometer and Mirau interference-microscope objective
Fig. 2. Equivalent optical path of interference-microscope objective with titled reference plate. (a) Sectional optical path of interference- microscope objective; (b) top view of pupil plane in interference-microscope objective; (c) division of S region in pupil plane
Fig. 6. Interference fringes under different tilts. (a) θ0=0°; (b) θ0=0.5°; (c) θ0=1°; (d) θ0=1.5°; (e) θ0=2°
Fig. 7. Comparison of morphology reconstruction results. (a) Primary morphology; (b) reconstruction errors under different tilts
Fig. 8. Measured results of step. (a) Information of standard step; (b) measured results of standard step by Veeco NT9100 profilometer
Fig. 9. Interference fringes and envelope amplitudes corresponding to different tilts of reference plate. (a) θ0=0°; (b) θ0=0.5°; (c) θ0=1°; (d) θ0=1.5°; (e) θ0=2°
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Hu Jie, Yuan Qun, Yu Haobiao, Wang Shuai, Sun Yifeng, Gao Zhishan. Assembly Error Tolerance of Interferometer Plate in Mirau Interference-Microscope Objective[J]. Chinese Journal of Lasers, 2019, 46(9): 904001
Category: Measurement and metrology
Received: Mar. 7, 2019
Accepted: --
Published Online: Sep. 10, 2019
The Author Email: Zhishan Gao (zhishgao@njust.edu.cn)