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Chinese Optics Letters, Volume. 7, Issue 8, 08738(2009)

Influence of interface roughness on reflectivity of tungsten/boron-carbide multilayers with variable bi-layer number by X-ray reflection and diffuse scattering

Min Dai1,2, Zhong Zhang1, Jingtao Zhu1, Xiaoqiang Wang1, Jing Xu1, Xiuhua Fu2, Liang Bai1, Qiushi Huang1, Zhanshan Wang1, and Lingyan Chen1
Author Affiliations
  • 1Institute of Precision Optical Engineering, Department of Physics, Tongji University, Shanghai 200092, China
  • 2Department of Physics, Changchun University of Science and Technology, Changchun 130022, China
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    Cited By

    [1] Haixia Wang, Dechao Xu, Jie Zhu, Zhong Zhang, Radhwan Alnaimi, Baozhong Mu, Zhanshan Wang, Hong Chen. Investigation in the interface roughness of DC-sputtered Mo/B4C multilayer mirrors with variable layer pairs for 7-nm soft X-ray polarizers. Optik, 125, 3415(2014).

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    Min Dai, Zhong Zhang, Jingtao Zhu, Xiaoqiang Wang, Jing Xu, Xiuhua Fu, Liang Bai, Qiushi Huang, Zhanshan Wang, Lingyan Chen, "Influence of interface roughness on reflectivity of tungsten/boron-carbide multilayers with variable bi-layer number by X-ray reflection and diffuse scattering," Chin. Opt. Lett. 7, 08738 (2009)

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    Paper Information

    Received: Nov. 5, 2008

    Accepted: --

    Published Online: Aug. 17, 2009

    The Author Email:

    DOI:10.3788/COL20090708.0738

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology