Influence of interface roughness on reflectivity of tungsten/boron-carbide multilayers with variable bi-layer number by X-ray reflection and diffuse scattering

Min Dai; Zhong Zhang; Jingtao Zhu; Xiaoqiang Wang; Jing Xu; Xiuhua Fu; Liang Bai; Qiushi Huang; Zhanshan Wang; Lingyan Chen

doi:10.3788/COL20090708.0738

Chinese Optics Letters, Volume. 7, Issue 8, 08738(2009)

Influence of interface roughness on reflectivity of tungsten/boron-carbide multilayers with variable bi-layer number by X-ray reflection and diffuse scattering

Min Dai^1,2, Zhong Zhang¹, Jingtao Zhu¹, Xiaoqiang Wang¹, Jing Xu¹, Xiuhua Fu², Liang Bai¹, Qiushi Huang¹, Zhanshan Wang¹, and Lingyan Chen¹

Author Affiliations

¹Institute of Precision Optical Engineering, Department of Physics, Tongji University, Shanghai 200092, China

²Department of Physics, Changchun University of Science and Technology, Changchun 130022, China

show less

Cited By

Article index updated: Nov. 2, 2024

Citation counts are provided from Web of Science. The counts may vary by service, and are reliant on the availability of their data.

The article is cited by 5 article(s) from Web of Science.

Tools

Get Citation

Copy Citation Text

Min Dai, Zhong Zhang, Jingtao Zhu, Xiaoqiang Wang, Jing Xu, Xiuhua Fu, Liang Bai, Qiushi Huang, Zhanshan Wang, Lingyan Chen, "Influence of interface roughness on reflectivity of tungsten/boron-carbide multilayers with variable bi-layer number by X-ray reflection and diffuse scattering," Chin. Opt. Lett. 7, 08738 (2009)

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites

Paper Information

Received: Nov. 5, 2008

Accepted: --

Published Online: Aug. 17, 2009

The Author Email:

DOI:10.3788/COL20090708.0738

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology