Chinese Journal of Quantum Electronics, Volume. 42, Issue 4, 504(2025)

Measurement of detection system tilt and evaluation of tilt‐induced errors in atomic shear interferometer

PANG Yuxuan1, ZHOU Lu2,3, YAN Sitong2, JIANG Junjie2,3, HE Chuan2, XU Rundong2, ZHANG Baocheng1、*, ZHOU Lin2,4、**, WANG Jin2,4, and ZHAN Mingsheng2,4
Author Affiliations
  • 1School of Mathematics and Physics, China University of Geosciences (Wuhan), Wuhan 430074, China
  • 2State Key Laboratory of Magnetic Resonance and Atomic and Molecular Physics, Innovation Academy forPrecision Measurement Science and Technology, Chinese Academy of Sciences, Wuhan 430071, China
  • 3University of Chinese Academy of Sciences, Beijing 100049, China
  • 4Hefei National Laboratory, Hefei 230088, China
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    Yuxuan PANG, Lu ZHOU, Sitong YAN, Junjie JIANG, Chuan HE, Rundong XU, Baocheng ZHANG, Lin ZHOU, Jin WANG, Mingsheng ZHAN. Measurement of detection system tilt and evaluation of tilt‐induced errors in atomic shear interferometer[J]. Chinese Journal of Quantum Electronics, 2025, 42(4): 504

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    Paper Information

    Category: Special Issue on...

    Received: Feb. 17, 2025

    Accepted: --

    Published Online: Jul. 31, 2025

    The Author Email: Baocheng ZHANG (zhangbaocheng@cug.edu.cn), Lin ZHOU (lzhou@apm.ac.cn)

    DOI:10.3969/j.issn.1007-5461.2025.04.006

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