Chinese Journal of Quantum Electronics, Volume. 42, Issue 4, 504(2025)

Measurement of detection system tilt and evaluation of tilt‐induced errors in atomic shear interferometer

PANG Yuxuan1, ZHOU Lu2,3, YAN Sitong2, JIANG Junjie2,3, HE Chuan2, XU Rundong2, ZHANG Baocheng1、*, ZHOU Lin2,4、**, WANG Jin2,4, and ZHAN Mingsheng2,4
Author Affiliations
  • 1School of Mathematics and Physics, China University of Geosciences (Wuhan), Wuhan 430074, China
  • 2State Key Laboratory of Magnetic Resonance and Atomic and Molecular Physics, Innovation Academy forPrecision Measurement Science and Technology, Chinese Academy of Sciences, Wuhan 430071, China
  • 3University of Chinese Academy of Sciences, Beijing 100049, China
  • 4Hefei National Laboratory, Hefei 230088, China
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    Figures & Tables(5)
    Schematic diagram of the principle of atomic shear interferometer, tilt of detection system, and experimental setup. (a) Spatiotemporal evolution of Mach-Zehnder atom interferometer; (b) The optical path difference introduced by the inclination angle of Raman light reflector; (c) Detection system with vertical tilt angle α in the CCD; (d) Experimental setup of atom interferometer
    The dual-species atomic shear interference fringes. (a) Fluorescence image of atomic clouds; (b) Fitting pattern of fringes
    The measured tilt angle of the goniometer using a plumb line changing with the set angle
    Schematic diagram of single-species atomic shear interference fringes (a) and variation of the interference fringe phase with ∆y' (b)
    (a) Relationship between differential phase shift and tilt angle α using simultaneous dual-internal-state detection 87Rb single-species atomic interferometric phase shift method, where the phase corresponding to the green line is π; (b) Relationship between dual-species atom interferometric differential phase shift and tilt angle α using the alternative detection atomic interferometric phase shift method (The red and black lines represent the phase shift before and after alternating detection, respectively, and the blue line represents the averaged phase)
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    Yuxuan PANG, Lu ZHOU, Sitong YAN, Junjie JIANG, Chuan HE, Rundong XU, Baocheng ZHANG, Lin ZHOU, Jin WANG, Mingsheng ZHAN. Measurement of detection system tilt and evaluation of tilt‐induced errors in atomic shear interferometer[J]. Chinese Journal of Quantum Electronics, 2025, 42(4): 504

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    Paper Information

    Category: Special Issue on...

    Received: Feb. 17, 2025

    Accepted: --

    Published Online: Jul. 31, 2025

    The Author Email: Baocheng ZHANG (zhangbaocheng@cug.edu.cn), Lin ZHOU (lzhou@apm.ac.cn)

    DOI:10.3969/j.issn.1007-5461.2025.04.006

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