Imaging ultrafast evolution of subwavelength-sized topography using single-probe structured light microscopy

Jie Xu; Changjun Min; Yuquan Zhang; Jielei Ni; Gengwei Cao; Qianyi Wei; Jianjun Yang; Xiaocong Yuan

doi:10.1364/PRJ.458613

Photonics Research, Volume. 10, Issue 8, 1900(2022)

Imaging ultrafast evolution of subwavelength-sized topography using single-probe structured light microscopy

Jie Xu¹, Changjun Min^1,3、*, Yuquan Zhang^1,4、*, Jielei Ni¹, Gengwei Cao¹, Qianyi Wei¹, Jianjun Yang², and Xiaocong Yuan^1,5、*

Author Affiliations

¹Nanophotonics Research Center, Shenzhen Key Laboratory of Micro-Scale Optical Information Technology & Institute of Microscale Optoelectronics, Shenzhen University, Shenzhen 518060, China

²State Key Laboratory of Applied Optics, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China

³e-mail: cjmin@szu.edu.cn

⁴e-mail: yqzhang@szu.edu.cn

⁵e-mail: xcyuan@szu.edu.cn

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Supplementary Materials

Visualization 1 | Ultrafast evolution of the topography on Si surface impacted by fs laser pulse.

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Jie Xu, Changjun Min, Yuquan Zhang, Jielei Ni, Gengwei Cao, Qianyi Wei, Jianjun Yang, Xiaocong Yuan, "Imaging ultrafast evolution of subwavelength-sized topography using single-probe structured light microscopy," Photonics Res. 10, 1900 (2022)

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Paper Information

Category: Imaging Systems, Microscopy, and Displays

Received: Mar. 17, 2022

Accepted: Jun. 21, 2022

Published Online: Jul. 27, 2022

The Author Email: Changjun Min (cjmin@szu.edu.cn), Yuquan Zhang (yqzhang@szu.edu.cn), Xiaocong Yuan (xcyuan@szu.edu.cn)

DOI:10.1364/PRJ.458613

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology