Chinese Journal of Lasers, Volume. 33, Issue 7, 959(2006)

New Measurement Method of Thickness and Refractive Index of the Film Grown on the Strong Absorption Substrate

[in Chinese]*, [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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    References(6)

    [2] [2] D. E. Aspnes, A. A. Studna. Dielectric functions and optical parameters of Si, Ge, GaP, GaAs, GaSb, InP, InAs, and InSb from 1.5 to 6.0 eV [J]. Phys. Rev. B, 1983, 27(2):985~1004

    [3] [3] Honggen Li, Zhuangqi Cao, Haifeng Lu et al.. Free-space coupling of a light beam into a symmetrical metal-cladding optical waveguide [J]. Appl. Phys. Lett., 2003, 83(14):2757~2759

    [5] [5] W. P. Chen, J. M. Chen. Use of surface plasma waves for determination of the thickness and optical constants of thin metallic films [J]. J. Opt. Soc. Am., 1981, 71(2):189~191

    [6] [6] L. G. Schulz, F. R. Tancherlini. Optical constants of silver, gold, copper, and aluminum. Ⅱ. The index of refraction n [J]. J. Opt. Soc. Am., 1954, 44(5):362~368

    [7] [7] L. G. Schulz. Optical constants of silver, gold, copper, and aluminum. Ⅰ. The absorption coefficient k [J]. J. Opt. Soc. Am., 1954, 44(5):357~362

    [8] [8] Yi Jiang, Zhuangqi Cao, Qishun Shen et al.. Improved attenuated-total-reflection technique for measuring the electro-optic coefficients of nonlinear optical polymers [J]. J. Opt. Soc. Am. B, 2000, 17(5):805~808

    CLP Journals

    [1] Chen Lin, Peng Yan, Yuan Minghui, Zhu Yiming. Investigation of Interference Fringes of Reflected Beam on Double Metal-Cladding Structure[J]. Chinese Journal of Lasers, 2010, 37(12): 3145

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. New Measurement Method of Thickness and Refractive Index of the Film Grown on the Strong Absorption Substrate[J]. Chinese Journal of Lasers, 2006, 33(7): 959

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    Paper Information

    Category: materials and thin films

    Received: Oct. 12, 2005

    Accepted: --

    Published Online: Aug. 8, 2006

    The Author Email: (xbz15@sjtu.edu.cn)

    DOI:

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