Chinese Journal of Lasers, Volume. 33, Issue 7, 959(2006)
New Measurement Method of Thickness and Refractive Index of the Film Grown on the Strong Absorption Substrate
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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. New Measurement Method of Thickness and Refractive Index of the Film Grown on the Strong Absorption Substrate[J]. Chinese Journal of Lasers, 2006, 33(7): 959
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