Acta Optica Sinica, Volume. 42, Issue 2, 0214003(2022)
Point Cloud Registration Method Based on Dual Quaternion Description of Line-Planar Feature Constraints
Fig. 1. Spatial geometric relation between straight line and plane. (a) Selected line-planar features in un-registered point cloud; (b) selected line-planar features in target point cloud
Fig. 3. Point cloud data of station 16 and station 17 before and after registration. (a) Before registration; (b) after registration
Fig. 4. Influence of noise standard deviation on registration accuracy under different conditions. (a) Angle between lines; (b) angle between planes
|
|
|
|
Get Citation
Copy Citation Text
Raobo Li, Xiping Yuan, Shu Gan, Rui Bi, Sha Gao, Yan Guo. Point Cloud Registration Method Based on Dual Quaternion Description of Line-Planar Feature Constraints[J]. Acta Optica Sinica, 2022, 42(2): 0214003
Category: Lasers and Laser Optics
Received: Jun. 28, 2021
Accepted: Aug. 17, 2021
Published Online: Dec. 29, 2021
The Author Email: Gan Shu (n1480@qq.com)