Researching | An Atomic Force Microscope

Acta Optica Sinica, Volume. 15, Issue 1, 112(1995)

An Atomic Force Microscope

[in Chinese], [in Chinese], [in Chinese], and [in Chinese]

Author Affiliations

[in Chinese]

show less

Abstract Get PDF(in Chinese)

Figures&Tables (0)

Paper Information

References(0)

CLP Journals

[1] Fu Xia, Xie Zhigang, Zhang Haijun, Zhang Dongxian. A Novel Electrochemical Atomic Force Microscope and its Applications[J]. Chinese Journal of Lasers, 2008, 35(s2): 147

[2] Guo Li, Zhou Yage, Zhang Dongxian, Zhang Haijun. A Dual-probe Three-Dimensional Profile Measurement System[J]. Acta Optica Sinica, 2008, 28(s2): 249

Tools

Get Citation

Copy Citation Text

[in Chinese], [in Chinese], [in Chinese], [in Chinese]. An Atomic Force Microscope[J]. Acta Optica Sinica, 1995, 15(1): 112

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites

Paper Information

Category: Instrumentation, Measurement and Metrology

Received: Oct. 19, 1993

Accepted: --

Published Online: Aug. 17, 2007

The Author Email:

DOI:

Topics

laser devices and laser physics

Lasers and Laser Optics

laser manufacturing

Instrumentation, Measurement and Metrology