An Atomic Force Microscope

Acta Optica Sinica, Volume. 15, Issue 1, 112(1995)

[in Chinese], [in Chinese], [in Chinese], and [in Chinese]

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[in Chinese]

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[in Chinese], [in Chinese], [in Chinese], [in Chinese]. An Atomic Force Microscope[J]. Acta Optica Sinica, 1995, 15(1): 112

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Category: Instrumentation, Measurement and Metrology

Received: Oct. 19, 1993

Accepted: --

Published Online: Aug. 17, 2007

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