Semiconductor Optoelectronics, Volume. 45, Issue 2, 222(2024)

Influence of Ionization Effect on Gain of Electron Multiplying Layer in EBCMOS

CHEN Wene1, CHEN Weijun1, SONG De1, JIAO Gangcheng2, LI Ye1, ZHAO Peng1, LI Shuhan1, WANG Chongxiao1, LIANG Rongxuan1, and YUE Jipeng1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • show less
    Figures & Tables(0)
    Tools

    Get Citation

    Copy Citation Text

    CHEN Wene, CHEN Weijun, SONG De, JIAO Gangcheng, LI Ye, ZHAO Peng, LI Shuhan, WANG Chongxiao, LIANG Rongxuan, YUE Jipeng. Influence of Ionization Effect on Gain of Electron Multiplying Layer in EBCMOS[J]. Semiconductor Optoelectronics, 2024, 45(2): 222

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category:

    Received: Dec. 18, 2023

    Accepted: --

    Published Online: Aug. 14, 2024

    The Author Email:

    DOI:10.16818/j.issn1001-5868.2023121801

    Topics