Semiconductor Optoelectronics, Volume. 45, Issue 2, 222(2024)
Influence of Ionization Effect on Gain of Electron Multiplying Layer in EBCMOS
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CHEN Wene, CHEN Weijun, SONG De, JIAO Gangcheng, LI Ye, ZHAO Peng, LI Shuhan, WANG Chongxiao, LIANG Rongxuan, YUE Jipeng. Influence of Ionization Effect on Gain of Electron Multiplying Layer in EBCMOS[J]. Semiconductor Optoelectronics, 2024, 45(2): 222
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Received: Dec. 18, 2023
Accepted: --
Published Online: Aug. 14, 2024
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